AFM / SPM / SEM

	Angstrom Advanced AA2000 Atomic Force Microscope (AFM) Angstrom Advanced Combined Atomic Force Microscope(AFM) and Lateral Force Microscope(LFM)
	Angstrom Advanced AA3000 Scanning Probe Microscope(SPM) Angstrom Advanced Combined Scanning Force Microscope(SPM), Atomic Force microscope(AFM) and Lateral ForceMicroscope(LFM)
	Angstrom Advanced AA5000 Multi-function Scanning Probe Microscope(SPM) Systems Full range of Angstrom Advanced STM, AFM, LFM, Conductive AFM, MFM, EFM, Environmental Control SPM and Nano-Processing
	Angstrom Advanced OS-AA Opening Multi-function Scanning Probe Microscope(SPM) Full range of Angstrom Advanced STM, AFM, LFM, MFM, EFM Full openness for further developments
	Angstrom Advanced AA8000 Multi-function Scanning Electron System(SEM) Angstrom Advanced AA8000 combines high performance in all SEM modes & Particle counter with ease of operation in a multi-user materials research environment